IEEE-USA Cites 5 Engineering Breakthroughs - From Restoring A Degree Of Eyesight To Developing A New Treatment For Sudden Cardiac Arrest

Main Category: Medical Devices / Diagnostics
Also Included In: Eye Health / Blindness;  Cardiovascular / Cardiology;  IT / Internet / E-mail
Article Date: 21 Aug 2010 - 0:00 PDT


Five engineering breakthroughs, from restoring a degree of eyesight to developing a new treatment for sudden cardiac arrest, were cited yesterday by IEEE-USA, the U.S. career and public policy unit of the IEEE, the world's largest professional association for the advancement of technology.

The five breakthroughs, as included in television news reports recently distributed to 83 subscribing U.S. television stations, are:

1. "Breakthroughs for Blindness," in which ophthalmologists have restored a degree of sight to blind patients by creating an artificial retina that receives a wireless signal from a camera worn by the patient

2. "Shock to the Heart," in which electrophysiologists have implanted a new kind of defibrillator for the treatment of sudden cardiac arrest that decreases the risks of complications associated with wires connecting the device to the heart

3. "Operating in 3-D," in which plastic surgeons are using specialized software to visualize a patient's surgical jaw alignment before they begin surgery -- allowing surgeons to be more precise in the procedure and obtain more predictable outcomes

4. "Computer Coaches for Shutter Bugs," in which computer scientists have developed a photo-rating program that identifies photos deemed most appealing to Internet users -- comparing uploaded images with thousands of photos individuals have rated using photo-sharing Web sites

5. "Green Wheel for Eco-Cyclists," in which architects and civil engineers have designed a bicycle wheel equipped with a battery and motor to replace the rear wheel of a standard bike -- providing eco-friendly assistance to the rider

To view these IEEE-USA underwritten reports, developed in collaboration with the American Institute of Physics, go to http://www.aip.org/dbis/IEEE. Source:
Pender M. McCarter
IEEE-USA

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